Software-based Repair for Memories in Tiny Embedded Systems
Author: | Mario Schölzel, Patryk Skoncej, Frank Vater |
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ISBN: | 978-1-4799-7603-4 |
Title of the source (English): | 20th IEEE European Test Symposium (ETS), 25-29 May, Cluj-Napoca, Romania 2015 |
Publisher: | IEEE |
Place of publication: | Piscataway, NJ |
Document Type: | Conference Proceeding |
Language: | English |
Year of publication: | 2015 |
Number of pages: | 2 |
Faculty/Chair: | Fakultät 1 MINT - Mathematik, Informatik, Physik, Elektro- und Informationstechnik / FG Systeme |