On the Feasibility of Handling Manufacturing Faults in Embedded Memories by Software Means
Author: | Mario Schölzel, Patryk Skoncej, Frank Vater |
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ISBN: | 978-1-4799-6972-2 |
Title of the source (English): | IEEE International Workshop of Electronics, Control, Measurement, Signals and their Application to Mechatronics (ECMSM) |
Publisher: | IEEE |
Place of publication: | Piscataway, NJ |
Document Type: | Conference Proceeding |
Language: | English |
Year of publication: | 2015 |
Number of pages: | 6 |
Faculty/Chair: | Fakultät 1 MINT - Mathematik, Informatik, Physik, Elektro- und Informationstechnik / FG Systeme |