Test of automotive embedded processors with high diagnostic resolution
Author: | Christian Gleichner, Heinrich Theodor Vierhaus |
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ISBN: | 978-80-8086-256-5 |
Title of the source (English): | 2016 IEEE 19th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), Kosice, Slovakia, 2016 |
Publisher: | IEEE |
Place of publication: | Piscataway, NJ |
Document Type: | Conference Proceeding |
Language: | English |
Year of publication: | 2016 |
First Page: | 1 |
Last Page: | 6 |
Faculty/Chair: | Fakultät 1 MINT - Mathematik, Informatik, Physik, Elektro- und Informationstechnik / FG Technische Informatik |