Diagnostics self-test for dynamically scheduled superscalar processors based on reconfiguration techniques for handling permanent faults
Author: | Mario Schölzel, Tobias Koal, Heinrich Theodor Vierhaus |
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ISBN: | 978-1-4799-6155-9 |
ISBN: | 978-1-4799-6156-6 |
Title of the source (English): | International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2014), Amsterdam, Netherlands, 1 - 3 October 2014 |
Publisher: | IEEE |
Place of publication: | Piscataway, NJ |
Document Type: | Conference Proceeding |
Language: | English |
Year of publication: | 2014 |
First Page: | 27 |
Last Page: | 32 |
Faculty/Chair: | Fakultät 1 MINT - Mathematik, Informatik, Physik, Elektro- und Informationstechnik / FG Technische Informatik |