Photoluminescence and EBIC for Process Control and Failure Analysis in Si-Based Photovoltaics
Author: | Martin Kittler, Tzanimir V. ArguirovGND, Reiner P. Schmid, Winfried Seifert |
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ISBN: | 978-1-61503-041-5 |
ISBN: | 0-61503-041-7 |
Title of the source (English): | ISTFA 2010, conference proceedings from the 36th International Symposium for Testing and Failure Analysis, November 14-18, 2010 |
Publisher: | ASM International Materials Park |
Place of publication: | Texas, USA |
Document Type: | Conference Proceeding |
Language: | English |
Year of publication: | 2010 |
Tag: | Photoluminescence |
First Page: | 137 |
Last Page: | 142 |
Faculty/Chair: | Fakultät 2 Umwelt und Naturwissenschaften / AG Physikalische Chemie II |