Surface Analytical Characterization of Horizontal and Vertical Nanotopographies at the Silicon/Silicon Oxide/Electrolyte Phase Boundaries
Author: | Michael Lublow |
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URN: | urn:nbn:de:kobv:co1-opus-14390 |
Document Type: | Doctoral thesis |
Language: | English |
Year of publication: | 2009 |
Number of pages: | 193 |
Faculty/Chair: | Fakultät 1 MINT - Mathematik, Informatik, Physik, Elektro- und Informationstechnik / FG Experimentalphysik und funktionale Materialien |