Residual stress distribution and silicon phase transformation induced by Rockwell indentation at different temperatures, studied by means of micro-Raman spectroscopy
Author: | Simona Kouteva-Arguirova, Valeri Orlov, Winfried Seifert, Hans Richter, Jürgen ReifGND |
---|---|
ISSN: | 1662-9779 |
ISSN: | 0377-6883 |
Title of the source (English): | Solid State Phenomena |
Document Type: | Scientific journal article peer-reviewed |
Language: | English |
Year of publication: | 2004 |
Volume/Year: | 95-96 |
First Page: | 513 |
Last Page: | 518 |
Faculty/Chair: | Fakultät 1 MINT - Mathematik, Informatik, Physik, Elektro- und Informationstechnik / FG Experimentalphysik und funktionale Materialien |