Femtosecond nonlinear optical characterization of silicon wafers: the role of symmetry
Author: | Jürgen ReifGND, Thomas Schneider, Dirk Wolfframm, Reiner P. Schmid |
---|---|
ISSN: | 1369-8001 |
Title of the source (English): | Materials Science in Semiconductor Processing |
Document Type: | Scientific journal article peer-reviewed |
Language: | English |
Year of publication: | 2001 |
Volume/Year: | 4 |
Issue number: | 1-3 |
First Page: | 241 |
Last Page: | 243 |
Faculty/Chair: | Fakultät 1 MINT - Mathematik, Informatik, Physik, Elektro- und Informationstechnik / FG Experimentalphysik und funktionale Materialien |