Analysis of local electric properties of grain boundaries in Si by electron-beam-induced-current techniques
Author: | Stanislaw Pandelov, Winfried Seifert, Martin Kittler, Jürgen ReifGND |
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ISSN: | 0953-8984 |
Title of the source (English): | Journal of Physics: Condensed Matter |
Document Type: | Scientific journal article peer-reviewed |
Language: | English |
Year of publication: | 2002 |
Volume/Year: | 14 |
Issue number: | 48 |
First Page: | 13161 |
Last Page: | 13168 |
Faculty/Chair: | Fakultät 1 MINT - Mathematik, Informatik, Physik, Elektro- und Informationstechnik / FG Experimentalphysik und funktionale Materialien |