Self Repair by Program Reconfiguration in VLIW Processor Architectures
Author: | Mario Schölzel, Pawel Pawlowski, Adam Dabrowski |
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ISBN: | 978-1-6096-0212-3 |
Title of the source (English): | Design and test technology for dependable systems-on-chip |
Publisher: | Information Science Reference |
Place of publication: | Hershay, Pa. [u.a.] |
Contributor(s): | Raimund Ubar, Jaan Raik, Heinrich Theodor Vierhaus |
Document Type: | Conference Proceeding |
Language: | English |
Year of publication: | 2011 |
First Page: | 241 |
Last Page: | 266 |
Faculty/Chair: | Fakultät 1 MINT - Mathematik, Informatik, Physik, Elektro- und Informationstechnik / FG Technische Informatik |
Institution name at the time of publication: | Fakultät für Mathematik, Naturwissenschaften und Informatik (eBTU) / LS Technische Informatik |