SoC Self Test Based on a Test Processor
Author: | Tobias Koal, René Kothe, Heinrich Theodor Vierhaus |
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ISBN: | 978-1-6096-0212-3 |
Title of the source (English): | Design an Test Technology for Dependable Systems on Chip |
Publisher: | IGI Global |
Place of publication: | Hershey [u.a.] |
Contributor(s): | Heinrich Theodor Vierhaus, Raimund Ubar, Jaan Raik |
Document Type: | Conference Proceeding |
Language: | English |
Year of publication: | 2011 |
First Page: | 360 |
Last Page: | 375 |
Faculty/Chair: | Fakultät 1 MINT - Mathematik, Informatik, Physik, Elektro- und Informationstechnik / FG Technische Informatik |
Institution name at the time of publication: | Fakultät für Mathematik, Naturwissenschaften und Informatik (eBTU) / LS Technische Informatik |